A Publication List of the Laboratory Since 1995

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1997

[1] Shao Limin, Tang Bing, Shao Xueguang, Zhao Guiwen, Liu Shantang
Wavelet transform treatment of noise in high performance liquid chromatography
Chinese Journal of Analytical Chemistry (Chinese Journal), 1997, 25(1):15-18
[2] Cai Wensheng, Shao Xueguang, Zhao Guiwen, Zhang Maosen
Genetic algorithms and its applications in analytical chemistry
Chinese Journal of Analytical Chemistry (Chinese Journal), 1997, 25(2):231-237
[3] Shao Xueguang, Tang Bing, Cai Wensheng
Software development and applications of chemical factor analysis
Computers and Applied Chemistry (Chinese Journal), 1997, 14(1):68-69
[4] Xueguang Shao, Wensheng Cai, Peiyan Sun, Maosen Zhang, Guiwen Zhao
Quantitative Determination of the Components in Overlapping Chromatographic Peaks Using Wavelet Transform
Analytical Chemistry, 1997, 69(9):1722-1725
[5] Shao Xueguang, Shao Limin, Zhao Guiwen
Application of Wavelet Transform and WFA in Analyzing the Overlapping Chromatogram of Rare-earth Elements
Kidorui (Journal of the Rare Earth Society of Japan), 1997, (30):204-205
[6] Shao Xueguang, Chen Zonghai, Zhao Guiwen
Quantitative Determination of Rare-earths by Stepwise Regression and Artificial Neural Network
Kidorui (Journal of the Rare Earth Society of Japan), 1997, (30):206-207
[7] Shao Xueguang, Sun Peiyan, Cai Wensheng, Zhang Maosen
Wavelet transform and its application to the resolution of the overlapping chromatograms
Chemistry (Chinese Journal), 1997, (7):54-57
[8] Shao Xueguang, Sun Peiyan, Cai Wensheng, Zhang Maosen
Resolution of overlapping chromatograms by wavelet transform
Chinese Journal of Analytical Chemistry (Chinese Journal), 1997, 25(6):671-674
[9] Chengyun Wang, Xueguang Shao, Qingde Su, Zhiwen Cheng, Guiwen Zhao
Preparation of Nd2O3 Thin Films by a Novel Sol-Gel Dipping Process
Physica Status Solidi (a), 1997, 162(2):623-630
[10] Wang Chengyun, Shao Xueguang, Mao Junjun, Su Qingde, and Zhao Guiwen
Optical Determination of the thickness of thin films symmetrically deposited on both sides of the substrates
Measurement Science and Technology, 1997, 8:911-916